Standards Alignment¶
The CILM framework is designed to operationalize the principles of established electronic component verification and risk management standards. The architecture is standards-aligned, providing structured methodologies that map to key practices defined by industry organizations and research institutions.
Verification Levels (L1–L3)¶
CILM implements a tiered verification structure:
- L1 (Basic Verification): Documentation review, visual inspection, and preliminary provenance assessment.
- L2 (Intermediate Verification): Detailed analytical testing, electrical characterization, and lifecycle documentation validation.
- L3 (Advanced Verification): Comprehensive material analysis, destructive physical analysis (DPA), and advanced structural verification (performed only when applicable and by qualified laboratories).
Digital Component Passport (DCP) Architecture¶
The Digital Component Passport (DCP) serves as the primary data structure for maintaining component lifecycle and verification records within the CILM framework. The DCP aggregates provenance data, test results, and compliance documentation into a structured format for risk assessment and traceability.
Methodological Mapping¶
The CILM framework provides methodological infrastructure designed to align with the operational objectives of several reference frameworks:
- SAE AS6081: The framework supports the principles of fraudulent/counterfeit electronic parts avoidance, detection, mitigation, and disposition for distributors.
- SAE AS6171: The verification levels (L1-L3) are designed to provide operational workflows that align with the test methods and risk assessment criteria for suspect/counterfeit parts.
- NIST SP 800-161r1: The supply chain risk intelligence and supplier due diligence models support the cybersecurity supply chain risk management practices outlined by NIST.
Note: CILM is an independent methodology and is not affiliated with or endorsed by SAE, IEEE, NIST, or any U.S. government agency.