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CILM shield chip mark CILM Component Integrity & Lifecycle Management
Electronic Component Supply Chain

Risk-scoring methodology
for counterfeit-resilient
component procurement

CILM provides a structured, auditable methodology for component verification, documentation integrity, and supply-chain risk intelligence — informed by OECD counterfeit-trade context and aligned with SAE AS6171 verification logic.

Microchip with PCB traces representing electronic component supply-chain risk intelligence
DatasetIEEE DataPort · N=67 White PaperZenodo · DOI Scoring modelCIRS · [0, 1] PreprintAuthor preprint · v1.9.2
01 — Scoring

Risk Intelligence

CIRS converts observable supplier, channel, market, verification, and geographic indicators into a normalized risk score.

CIRS [0, 1] · 5-parameter weighted composite
Risk Intelligence →
02 — Verification

Documentation Integrity

CILM connects procurement documentation, verification evidence, and lifecycle records into an auditable integrity layer.

SAE AS6171-aligned · L1–L3 verification
Standards Alignment →
03 — Provenance

Channel Provenance

Authorized-channel procurement establishes the risk floor; unknown-source procurement defines the structural risk ceiling.

S = 0.05 → 1.00 · channel-structure factor
Framework →
04 — U.S. Market

U.S. Application

Decision rules support risk-based procurement documentation in U.S. high-reliability supply-chain environments.

Decision rules · Auditable at procurement point
U.S. Application →
Structured methodology framework architecture
Framework

A structured methodology for component verification, documentation integrity, and lifecycle risk management.

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Global supply chain risk intelligence network
Risk Intelligence

CIRS scoring model — 5-parameter composite normalized [0, 1] across supplier, channel, and geographic indicators.

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Methodological white paper and research publications
White Papers

Methodological white paper published on Zenodo. DOI: 10.5281/zenodo.19657865

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Structured dataset and quantitative analysis
Datasets

CILM-IRI dataset (N=67) published on IEEE DataPort. DOI: 10.21227/34y3-zj88

Explore datasets →

Public research artifacts

ArtifactRepositoryDOI / Link
CILM Methodological White PaperZenodo10.5281/zenodo.19657865 ↗
CILM-IRI Dataset (N=67)IEEE DataPort10.21227/34y3-zj88 ↗
Methodological Article / PreprintThis siteData & Publications ↗

CILM is an independent methodology — not affiliated with or endorsed by SAE, IEEE, NIST, or any U.S. government agency.